首页> 外国专利> ION CHROMATOGRAPHY SYSTEM FOR ENVIRONMENTAL ANALYSIS OF SEMICONDUCTOR EQUIPMENT

ION CHROMATOGRAPHY SYSTEM FOR ENVIRONMENTAL ANALYSIS OF SEMICONDUCTOR EQUIPMENT

机译:用于半导体设备环境分析的离子色谱系统

摘要

An ion chromatography system for environmental analysis of semiconductor equipment according to the present invention comprises an atmospheric impingement type impinger device and ion chromatography, and the impinger device is an absorbent liquid container, an intake pipe and an exhaust pipe connecting the outside to the container. And an atmospheric pressure pump, wherein the ion chromatography has a guard column, a separation column, and a detector, wherein the intake port of the intake pipe is at a measurement target position, and the impinger device and the ion chromatography The chromatography is characterized in that the absorbent liquid of the absorbent liquid container is directly connected to the sample inlet of the ion chromatography.;Therefore, according to the ion chromatography system for environmental analysis of semiconductor equipment of the present invention, first, there is an advantage that the components of the atmosphere at the position to be measured can be analyzed immediately and the phenomenon can be dealt with promptly.
机译:根据本发明的用于半导体设备的环境分析的离子色谱系统包括大气撞击型冲击器装置和离子色谱法,并且该冲击器装置是吸收性液体容器,将外部与容器连接的进气管和排气管。 1.一种大气压泵,其特征在于,所述离子色谱仪具有保护柱,分离柱和检测器,所述进气管的进气口位于测量目标位置,所述冲击器装置和所述离子色谱仪的特征在于因此,根据本发明的用于半导体设备的环境分析的离子色谱系统,首先,其优点在于,所述吸收液容器的吸收液直接与离子色谱的样品入口连接。可以立即分析测量位置处的大气成分,并可以迅速解决该现象。

著录项

  • 公开/公告号KR100217499B1

    专利类型

  • 公开/公告日1999-09-01

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO LTD.;

    申请/专利号KR19960070903

  • 发明设计人 주진호;김상경;강성철;

    申请日1996-12-24

  • 分类号H01L21/48;H01L21/00;

  • 国家 KR

  • 入库时间 2022-08-22 02:15:32

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号