Complex digitial integrated circuit design method

摘要

The circuit design method uses the specified circuit functions for estimation of the required design, with testing of the application specific integrated circuit during its development via generated test patterns, provided automatically via test structures, incorporated in the integrated circuit, for detection of short-circuit paths. The test patterns are generated automatically using existing computer-aided design programmes, with the test structures for generating the test patterns pref. integrated as part of the application specific integrated circuit itself.