首页> 外国专利> Ionization chamber with double input window for measuring X-ray exposure

Ionization chamber with double input window for measuring X-ray exposure

机译:具有双输入窗口的电离室,用​​于测量X射线曝光

摘要

A dual entrance window ion chamber (10) is surrounded by a housing (50) with 1st and 2nd openings (54,56) covered by 1st and 2nd X-ray windows (120,122) on opposite sides of the chamber (10). A collector (100) in the chamber between the 2 windows collects electrons for use in measuring X-ray exposure. The 1st window (120) has its construction optimised to provide a relatively flat energy response to X-rays over a 1st energy range whilst the 2nd window (122) is so constructed to provide a flat response over a 2nd and greater energy level.
机译:双入射窗离子室(10)被壳体(50)围绕,该壳体(50)具有第一和第二开口(54,56),第一和第二开口(54,56)在该室(10)的相对侧上被第一和第二X射线窗(120,122)覆盖。两个窗口之间的腔室中的收集器(100)收集电子,用于测量X射线曝光。第一窗口(120)的结构被优化为在第一能量范围内对X射线提供相对平坦的能量响应,而第二窗口(122)被构造为在第二及更大能量水平上提供平坦的响应。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号