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Method for verifying electrically programmable non-volatile memory cells of an electrically programmable non-volatile memory device after programming

机译:编程后验证电可编程非易失性存储装置的电可编程非易失性存储单元的方法

摘要

A method for verifying an electrically programmable non- volatile memory cell of an electrically programmable memory device after programming, providing for accessing the memory cell after having submitted the same to at least a programming pulse by means of a sensing circuit, checking an output of the sensing circuit, and submitting said memory cell to further programming pulses if said output of the sensing circuit corresponds to a non-programmed memory cell. The checking an output of the sensing circuit is performed at a first instant of time which is anticipated of a prescribed time interval with respect to a second instant of time at which said output of the sensing circuit is checked in a normal read operation of the memory device, said prescribed time interval corresponding to a prescribed security margin of programming of the memory cell. (FIGS. 2 and 4).
机译:一种用于在编程之后验证电可编程存储装置的电可编程非易失性存储单元的方法,该方法用于在通过感测电路将存储单元提交给至少编程脉冲之后访问该存储单元,以检查存储单元的输出。感测电路,并且如果感测电路的所述输出对应于未编程的存储单元,则使所述存储单元经受进一步的编程脉冲。相对于在存储器的正常读取操作中检查感测电路的所述输出的第二时间的第二时间间隔,在规定的时间间隔所预期的第一时间点执行感测电路的输出的检查。所述预定时间间隔对应于存储单元的编程的预定安全裕度。 (图2和4)。

著录项

  • 公开/公告号US5864503A

    专利类型

  • 公开/公告日1999-01-26

    原文格式PDF

  • 申请/专利权人 SGS-THOMSON MICROELECTRONICS S.R.L.;

    申请/专利号US19970866531

  • 发明设计人 LUIGI PASCUCCI;

    申请日1997-05-30

  • 分类号G11C16/06;

  • 国家 US

  • 入库时间 2022-08-22 02:08:48

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