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Algorithmic array mapping to decrease defect sensitivity of memory devices

机译:算法阵列映射可降低存储设备的缺陷敏感性

摘要

A method and apparatus for addressing a memory device are described. A first logical address is translated into a first physical address to access a first storage location at a first row and a first column in an array of memory cells. A second logical address is translated into a second physical address to access a second storage location at a second row and a second column in the array of memory cells. The second row is separated from the first row by a row spacing factor. The second column is separated from the first column by a column spacing factor. The second level is separated from the first level by a level spacing factor. The row, column, and level spacing factors are chosen such that the first and second columns are physically distinct, the first and second rows are physically distinct, and the first and second storage locations do not share a same memory cell when the first and second logical addresses are sequential.
机译:描述了一种用于寻址存储设备的方法和装置。将第一逻辑地址转换为第一物理地址,以访问存储单元阵列中的第一行和第一列的第一存储位置。将第二逻辑地址转换为第二物理地址,以访问存储单元阵列中的第二行和第二列的第二存储位置。第二行与第一行的间隔系数为1。第二列与第一列之间的间隔为一列。第二级与第一级相隔一个水平间隔因子。选择行,列和电平间隔因子,以使第一列和第二列在物理上是不同的,第一行和第二行在物理上是不同的,并且当第一列和第二列在第二个存储位置时不共享同一存储单元逻辑地址是顺序的。

著录项

  • 公开/公告号US5943693A

    专利类型

  • 公开/公告日1999-08-24

    原文格式PDF

  • 申请/专利权人 INTEL CORPORATION;

    申请/专利号US19950412555

  • 发明设计人 ROGER E. BARTH;

    申请日1995-03-29

  • 分类号G06F11/00;

  • 国家 US

  • 入库时间 2022-08-22 02:07:26

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