首页> 外国专利> Halftone phase-shift mask and halftone phase-shift mask defect correction method

Halftone phase-shift mask and halftone phase-shift mask defect correction method

机译:半色调相移掩模和半色调相移掩模缺陷校正方法

摘要

In a halftone phase-shift mask, a phase-inverting light transmission part is formed inside the light-blocking part which blocks light that is radiated onto a transparent substrate so as to cover a shifter missing part defect, this phase-inverting light transmission part inverting the phase of light that passes through it with respect to light that passes through a light transmission part. The ratio between the surface areas of the phase-inverting light transmission part and the light-blocking part is established so that the transfer characteristics of the light-blocking part during exposure are substantially the same as those of the translucent phase-shift part.
机译:在半色调相移掩模中,在遮光部的内部形成有相位反转光透射部,该相位反转光透射部遮挡照射到透明基板上的光,以覆盖移位器缺失部缺陷,该相位反转光透射部。使通过光的相位相对于通过光透射部的光反转。建立反相光透射部分和遮光部分的表面积之比,以使曝光期间遮光部分的传递特性与半透明相移部分的传递特性基本相同。

著录项

  • 公开/公告号US5945237A

    专利类型

  • 公开/公告日1999-08-31

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号US19970998834

  • 发明设计人 HIROYOSHI TANABE;

    申请日1997-12-29

  • 分类号G03F9/00;

  • 国家 US

  • 入库时间 2022-08-22 02:07:24

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号