Semiconductor programmable test arrangement such as an antifuse ID circuit having common access switches and/or common programming switches

摘要

A semiconductor integrated circuit includes a plurality of programmable elements, each having a first terminal connected to a first power supply potential, and a second terminal. Each of a plurality of first semiconductor switching elements has a first terminal respectively connected to the second terminal of a corresponding one of the plurality of programmable elements and has a second terminal. Each of a plurality of second semiconductor switching elements has a first terminal connected in common to selected ones of the second terminals of the plurality of first semiconductor switching elements and has a second terminal connected to a second power supply potential. A method of programming a plurality of programmable elements grouped in a plurality of subgroups each in a respective one of a plurality of groups includes the steps of applying a programming signal to the subgroups in a respective one of the groups and applying an address signal at like respective terminals in each of said groups, with each which terminal there is associated one of said programmable elements, either the programming signal or the address signal being applied by a common switching element.