Is prepared by the thin film test portion method of preparation and the particular manner which for analysis designate the x-ray as the probe the thin film test portion

摘要

PURPOSE:To obtain a highly sensitive thin film measurement sample whose thickness is extremely thin, which contains no impurity and which is constituted by using a support excellent in mechanic and thermal strength in a thin film measurement sample used as a self-held standard sample or an analysis sample in analysis using X-rays as a probe such as fluorescent X-ray analysis, total reflection fluorescent X-ray analysis and PIXE method. CONSTITUTION:A polyvinyl former thin film, that is a form bar thin film 1, prepared with thickness of 20mumg/cm2 or less is used as a support for a standard sample or an analysis sample 2 being a self-held thin film measurement sample to constitute a thin film measurement sample. A high performance and highly sensitive thin film measurement sample for analysis can be obtained, which is appropriately used as a standard sample or an analysis sample such as a biological/medical sample or a sample for environmental, contamination wherein a self-held measurement sample has been difficult to prepare.