EMI design and evaluation methods of electronic equipment

摘要

PROBLEM TO BE SOLVED: To provide an EMI designing and evaluating method which enables the effective use time of EMI evaluation facilities and shortens the designing and evaluation period by saving the labor and material cost at the time of designing and evaluation. ;SOLUTION: Based on design data on a power source/GND layer extracted in an extracting process S14, a model is generated in a model generating process S19 and based on this model, surface analytic simulation is performed in a surface analytic simulation process S20. Simultaneously with this surface analytic simulation, a substrate having only the power source/GND layer is manufactured in a substrate manufacturing process S15 and the result of the surface analytic simulation is matched with the actual measurement result of a frequency characteristic S parameter by the manufactured substrate alone in a 1st measuring and investigating process S16; when they match each other, a bypass capacitor is mounted on the substrate having only the power source/GND layer in a bypass capacitor mounting process S17 and information on them is fed back to a mounting detailed designing process S8.;COPYRIGHT: (C)1999,JPO