首页> 外国专利> SHEARING INTERFEROMETER, REFRACTION INDEX DISTRIBUTION MEASURING DEVICE PROVIDED WITH THE INTERFEROMETER AND MEASURING METHOD FOR REFRACTION INDEX DISTRIBUTION

SHEARING INTERFEROMETER, REFRACTION INDEX DISTRIBUTION MEASURING DEVICE PROVIDED WITH THE INTERFEROMETER AND MEASURING METHOD FOR REFRACTION INDEX DISTRIBUTION

机译:剪切干涉仪,由该干涉仪提供的折射率指标的测量装置和折射率指标的测量方法

摘要

PROBLEM TO BE SOLVED: To provide a method for reducing ghost light and improving S/N ratio in a shearing interferometer. ;SOLUTION: For a shearing interferometer splitting detected wave of coherent light transmitted into a detected body into 2 light fluxes, giving the shift in vertical direction to the light axis between the two light fluxes and overlapping, two slab plates 45 and 47 arranged facing to each other via a small gap d are provided. The surfaces 47b and 45a among 4 surfaces 45a, 45b, 47a and 47b which those 2 slab plates 45 and 47 have are made parallel and at least a single surface among 47a or 45b is made non-parallel to the 2 parallel surfaces 47b and 45a. By this, ghost light is separated from the detected wave and a ghostless measurement becomes possible.;COPYRIGHT: (C)2000,JPO
机译:要解决的问题:提供一种在剪切干涉仪中减少重影光并提高信噪比的方法。 ;解决方案:对于剪切干涉仪,将传输到被检测物体中的相干光的检测波分成两个光束,使光轴在垂直方向上在两个光束之间发生偏移并重叠,两个平板45和47面向经由小间隙d彼此设置。使两个平板45和47具有的四个表面45a,45b,47a和47b中的表面47b和45a平行,并且使47a或45b中的至少一个表面与两个平行表面47b和45a不平行。 。这样,重影光就与检测到的波分离开了,并且可以进行无重影测量。版权所有:(C)2000,JPO

著录项

  • 公开/公告号JP2000249510A

    专利类型

  • 公开/公告日2000-09-14

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP19990049404

  • 发明设计人 SUHARA HIROYUKI;

    申请日1999-02-26

  • 分类号G01B9/02;G01B11/00;G01M11/02;

  • 国家 JP

  • 入库时间 2022-08-22 02:05:32

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