首页>
外国专利>
Judgment pattern amendment manner, judgment pattern amendment system and storage null for judgment pattern amendment
Judgment pattern amendment manner, judgment pattern amendment system and storage null for judgment pattern amendment
展开▼
机译:判断模式修改方式,判断模式修改系统及判断模式修改存储无效
展开▼
页面导航
摘要
著录项
相似文献
摘要
PROBLEM TO BE SOLVED: To simplify a production process, reduce a defect rate of clothes and obtain high quality clothes by measuring a shrinkage factor of a cloth after a sponging processing of the cloth for the clothes, and correcting a cutting pattern based on the data of the measured shrinkage factor. ;SOLUTION: This correction of a cutting pattern for cutting a cloth to plural parts is carried out by measuring the shrinkage factor of a cloth after a sponging processing of the cloth for the clothes and correcting the cutting pattern based on the measured shrinkage data. The measurement of the shrinkage factor is preferably carried out after adhering an interlining to the cloth, carrying out a press processing of the cloth with the adhered interlining, moisturizing the pressed cloth and further aging for a prescribed time. The correction system 1 of the cutting pattern preferably has a sponging means 10 for carrying out the sponging processing, a raw material-measuring means 20 for measuring the shrinkage factor of the cloth after processing the cloth with the sponging means 10, and a cutting pattern-correcting means 32 for correcting the cutting pattern based on the data measured by the raw-material-measuring means 20.;COPYRIGHT: (C)1998,JPO
展开▼