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The thin-shaped plastic semiconductor package null where the reliability which uses the copper lead/read frame

机译:薄型塑料半导体封装在使用铜引线/读取框架的可靠性方面无效

摘要

PROBLEM TO BE SOLVED: To enhance the reliability with respect to the package crack and separation problem by using a Cu alloy lead frame, in a plastic semiconductor package. ;SOLUTION: A plastic semiconductor package has a semiconductor chip 2 adhered to a die pad 3 on a lead frame L, having a surface oxide film and leads 4 connected to the chip through bonding wires 5, all being encapsulated with a resin mold 1 in one body. The lead frame is made of a Cu alloy, contg. Cr 0.05-O.4%, Zr 0.03-O.25% and Zn 0.06-2.0%, and if required Fe 0.1-1.8%r Ti 0.1-O.8% and/or at least one of Ni, Sn, In, Mn, P, Mg, and Si 0.01-1.0%, to thereby improve the adhesion to the lead frame mother material of the oxide film.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:通过在塑料半导体封装中使用Cu合金引线框架来提高有关封装破裂和分离问题的可靠性。 ;解决方案:一种塑料半导体封装,其半导体芯片2粘附在引线框架L的管芯焊盘3上,具有表面氧化膜,并且引线4通过键合线5连接到芯片,并全部用树脂模具1封装。一个身体。引线框由铜合金制成(续)。 Cr 0.05-O.4%,Zr 0.03-O.25%和Zn 0.06-2.0%,以及如果需要的话,Fe 0.1-1.8%r Ti 0.1-O.8%和/或Ni,Sn,In中的至少一种,Mn,P,Mg和Si为0.01-1.0%,从而提高氧化膜对引线框母材的附着力。; COPYRIGHT:(C)1998,JPO

著录项

  • 公开/公告号JP3080892B2

    专利类型

  • 公开/公告日2000-08-28

    原文格式PDF

  • 申请/专利权人 日鉱金属株式会社;

    申请/专利号JP19960354631

  • 发明设计人 富岡 靖夫;

    申请日1996-12-20

  • 分类号H01L23/50;

  • 国家 JP

  • 入库时间 2022-08-22 02:04:18

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