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Super high order accuracy three coordinate measuring machine

机译:超高精度三坐标测量机

摘要

PURPOSE:To make it possible to apply an ultrahigh-precision apparatus for three- dimensional measurement to a large-sized object to be measured as well. CONSTITUTION:A frame 3 moving horizontally in the direction of the X axis or the directions of the X-Y axes is provided on a base 1. On this frame 3, a Z-axis moving stage 5 moving up and down in the direction of the Z axis being vertical to the direction of the X axis and the directions of the X-Y axes is provided and further a measuring means 61 of measuring a distance Z1 between the surface to be measured of an object 7 to be measured which is fixed on the base 1 and a specified point on the Z-axis moving stage 5 positioned above the surface to be measured of the object is provided. A supporting body 8 fixed on the base 1 is provided with an X-Y axes reference plane 9 being vertical to the Z axis and positioned above the Z-axis moving stage 5, and with a measuring means 62 of measuring the distance Z2 between the X-Y axes reference surface 9 and the specified point on the Z-axis moving stage 5 positioned below the reference surface. The shape of the object to be measured is measured on the basis of the data on the distance Z1 and the distance Z2 to each measuring point in the directions of the X-Y axes of the object 7 to be measured.
机译:目的:为了能够将用于三维测量的超高精度设备应用于大型被测物体。组成:在底座1上水平移动的X轴或XY轴方向的框架3。在此框架3上,Z轴移动平台5沿Z方向上下移动。设置垂直于X轴方向和XY轴方向的轴线,并且还具有测量装置61,该测量装置61测量固定在基座1上的被测量物体7的被测量表面之间的距离Z1。在Z轴移动台5上,在被测定物的表面上方设置有指定点。固定在基座1上的支撑体8设置有与Z轴垂直且位于Z轴移动台5的上方的XY轴基准面9,以及用于测量XY轴之间的距离Z2的测量装置62。基准面9和位于基准面下方的Z轴移动台5上的指定点。基于到被测量物体7的X-Y轴方向上的到每个测量点的距离Z1和距离Z2的数据,测量被测量物体的形状。

著录项

  • 公开/公告号JP3046635B2

    专利类型

  • 公开/公告日2000-05-29

    原文格式PDF

  • 申请/专利权人 松下電器産業株式会社;

    申请/专利号JP19910064327

  • 发明设计人 金島 敬之介;吉住 恵一;

    申请日1991-03-28

  • 分类号G01B11/24;G01B21/20;

  • 国家 JP

  • 入库时间 2022-08-22 02:03:57

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