METHOD AND APPARATUS FOR GENERATION OF DEFECT-RELIEF TREATMENT INFORMATION

摘要

PROBLEM TO BE SOLVED: To improve the efficiency of a development by a method wherein, when a defective part is relieved and treated, an operation which humanly extracts information from circuit-design information and which generates relief- treatment information required by a testing device and a relief treatment device is excluded. ;SOLUTION: In this generation method, a defect-relief treatment information generation means 2-20 uses a circuit design information group 2-1, which contains a circuit design database 2-6 and a layout database 2-7. The generation means automatically generates a relief treatment condition 2-8 and fuse-data generating conditions 2-9 which are required by a semiconductor testing device 2-4. In addition, the generation means automatically generates fuse-coordinate information and fuse-blowing order information 2-10 required by a laser relief treatment device 2-5.;COPYRIGHT: (C)2000,JPO