METHOD FOR PREPARING TEST SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUIT AND SYSTEM FOR SUPPORTING PREPARATION OF TEST SPECIFICATION

摘要

PROBLEM TO BE SOLVED: To prepare test specifications for a newly developed integrated circuit in a short time by dividing internal circuits of a semiconductor integrated circuit by functions, registering for every function and forming them in a database and referring to, adding, utilizing the database when a fresh circuit is to be designed. ;SOLUTION: Internal circuits of a semiconductor integrated circuit are divided for every function beforehand. Measurement items, measurement conditions already proved are registered as a library for every function and formed in a database. When the semiconductor integrated circuit is to be designed new, the database is referred to and the registered measurement items, measurement conditions are utilized for existing functions. Measurement items, measurement conditions are determined and set new for functions not registered yet. A test specifications preparation-supporting program of these contents is loaded to a computer apparatus of a work station, etc., thereby constituting a system. Objective test specifications for a newly developed semiconductor integrated circuit can be formed in a short time and measurement conditions can be evaluated, corrected, changed easily.;COPYRIGHT: (C)2000,JPO