首页> 外国专利> LIGHT SOURCE FOR FLAW INSPECTION AND LIGHT SOURCE UNIT FOR FLAW INSPECTION

LIGHT SOURCE FOR FLAW INSPECTION AND LIGHT SOURCE UNIT FOR FLAW INSPECTION

机译:瑕疵检查光源和瑕疵检查光源装置

摘要

PROBLEM TO BE SOLVED: To illuminate an object to be inspected from the entire periphery of the side surface thereof and to perform proper inspection regardless of the direction placing the object.;SOLUTION: A quartz blank 1 is placed on a horizontal transparent mounting stand. The light emitted from a lower light source 20 constituted by arranging light emitting diodes 20A in an annular form is allowed to transmit through the mounting stand 2 obliquely from below to be concentrated to the quartz blank 1. At the same time, the light emitted from a lateral light source 21 constituted by annularly arranging light emitting diodes 21A is concentrated to the quartz blank 1 which is present at a center position from horizontal direction. The quartz blank 1 is photographed from a vertical upper part by a CCD camera 13 and the presence of a flaw is discriminated on the basis of the image thereof.;COPYRIGHT: (C)2000,JPO
机译:解决的问题:要从其侧面的整个外围照亮要检查的物体,并且无论放置物体的方向如何,都应进行适当的检查。解决方案:石英毛坯1放在水平透明的安装支架上。从下部光源20发出的光通过以环形形式布置发光二极管20A而被允许从下方倾斜地穿过安装台2,以会聚到石英毛坯1。由环形排列的发光二极管21A构成的横向光源21集中在石英毛坯1上,该石英毛坯1位于从水平方向开始的中心位置。用CCD照相机13从垂直的上部拍摄石英毛坯1,并根据其图像鉴别缺陷的存在。版权:(C)2000,JPO

著录项

  • 公开/公告号JP2000171401A

    专利类型

  • 公开/公告日2000-06-23

    原文格式PDF

  • 申请/专利权人 NIPPON MAKUSHISU:KK;

    申请/专利号JP19980350293

  • 发明设计人 KOBAYASHI SATORU;

    申请日1998-12-09

  • 分类号G01N21/84;

  • 国家 JP

  • 入库时间 2022-08-22 02:01:29

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