PROBLEM TO BE SOLVED: To obtain a magnetic-resonance-type exchange interaction force microscope that incorporates magnetization inversion/modulation technique due to magnetic resonance being utilized by electronic spin resonance and nuclear magnetic resonance into an atomic force microscope, and accurately measures exchange interaction force operating between a probe and a sample, and the measuring method of the exchange interaction force using it. SOLUTION: A magnetic-resonance-type exchange interaction force microscope is equipped with samples 1 and 11, probes 3 and 13 at the tip part of cantilevers 2 and 12 opposite to the samples 1 and 11, a means that applies electromagnetic force or electric force to the cantilevers 2 and 12, and means that generates prove magnetization inversion/modulation operation due to magnetic resonance and measures the exchange interaction force operating between the probes 3 and 13 and the samples 1 and 11.
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