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METHOD AND DEVICE FOR SELECTING STIMULATION POSITION IN CIRCUIT TEST WITH LIMITED ACCESS

机译:有限访问的电路测试中激励位置的选择方法和装置

摘要

PROBLEM TO BE SOLVED: To select a stimulus maximizing the branch voltage applied between both ends of a component by calculating and classifying the branch voltage (shunt voltage) for each stimulation position of a circuit, determining the performance index of each stimulation position via the rank order number allocated to the branch voltage, and selecting the stimulation position based on it.;SOLUTION: A cost function is applied to the branch voltages calculated on stimulation positions of individual components, the branch voltages are sorted in size, and duplicated values are removed. Useless branch voltages are set to zero, and the branch voltages existing in the predetermined elements are rounded to the same value. Zero is allocated to a set of minimum branch voltage values, different branch voltage values are allocated with rank order numbers in increments of 1, and the performance index on each stimulation position is calculated via the rank order number. One or multiple stimulation positions are selected according to various decision criteria based on the performance indexes.;COPYRIGHT: (C)2000,JPO
机译:解决的问题:通过计算和分类电路的每个刺激位置的分支电压(分流电压),并通过等级确定每个刺激位置的性能指标,以选择最大化组件两端之间施加的分支电压的刺激解决方案:将成本函数应用于根据单个组件的激励位置计算出的分支电压,对分支电压进行大小排序,并删除重复的值,然后将成本函数应用于分支电压。 。将无用的分支电压设置为零,并且将预定元件中存在的分支电压舍入为相同值。零被分配给一组最小分支电压值,不同的分支电压值被分配以等级序号(以1为增量),并且通过等级序号计算每个刺激位置的性能指标。根据性能指标,根据各种决策标准选择一个或多个刺激位置。;版权:(C)2000,JPO

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