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METHOD AND DEVICE FOR SELECTING STIMULATION POSITION IN CIRCUIT TEST WITH LIMITED ACCESS
METHOD AND DEVICE FOR SELECTING STIMULATION POSITION IN CIRCUIT TEST WITH LIMITED ACCESS
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机译:有限访问的电路测试中激励位置的选择方法和装置
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摘要
PROBLEM TO BE SOLVED: To select a stimulus maximizing the branch voltage applied between both ends of a component by calculating and classifying the branch voltage (shunt voltage) for each stimulation position of a circuit, determining the performance index of each stimulation position via the rank order number allocated to the branch voltage, and selecting the stimulation position based on it.;SOLUTION: A cost function is applied to the branch voltages calculated on stimulation positions of individual components, the branch voltages are sorted in size, and duplicated values are removed. Useless branch voltages are set to zero, and the branch voltages existing in the predetermined elements are rounded to the same value. Zero is allocated to a set of minimum branch voltage values, different branch voltage values are allocated with rank order numbers in increments of 1, and the performance index on each stimulation position is calculated via the rank order number. One or multiple stimulation positions are selected according to various decision criteria based on the performance indexes.;COPYRIGHT: (C)2000,JPO
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