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MECHANICAL-CHEMICAL POLISHING METHOD OF ALUMINUM OR ALUMINUM ALLOY CONDUCTIVE MATERIAL LAYER

机译:铝或铝合金导电材料层的机械化学抛光方法

摘要

PROBLEM TO BE SOLVED: To improve an aluminum layer in surface state by a method, wherein an aluminum layer is polished by the use of a polishing composition which contains a colloid silica particle alkaline aqueous suspension, tetra-alkyl ammonium hydroxide and an oxidizing agent. ;SOLUTION: An aluminum or an aluminum alloy conductive material layer is polished with a polishing composition, which contains an alkaline aqueous suspension which contains colloidal silica particles which are not siloxane- bonded, individuated discrete, and 35 to 50 nm in average grain diameter, an element selected from among tetramethyl ammonium hydroxide, tetraethyl ammonium hydroxide, tetrapropyl ammonium hydroxide, and an oxidizing agent. By this setup, an aluminum or aluminum alloy plate can be enhanced in polishing rate and improved in surface state.;COPYRIGHT: (C)2000,JPO
机译:解决的问题:通过一种方法来改善表面状态的铝层,其中通过使用抛光组合物抛光铝层,所述抛光组合物包含胶体二氧化硅颗粒碱性水悬浮液,四烷基氢氧化铵和氧化剂。 ;解决方案:用抛光剂抛光铝或铝合金导电材料层,其中包含碱性水悬浮液,该悬浮液包含非硅氧烷键合,单独离散的胶体二氧化硅颗粒,平均粒径为35至50 nm,元素选自氢氧化四甲基铵,氢氧化四乙基铵,氢氧化四丙基铵和氧化剂。通过这种设置,可以提高铝板或铝合金板的抛光速度并改善其表面状态。;版权所有:(C)2000,JPO

著录项

  • 公开/公告号JP2000243734A

    专利类型

  • 公开/公告日2000-09-08

    原文格式PDF

  • 申请/专利权人 CLARIANT FR SA;

    申请/专利号JP20000036011

  • 申请日2000-02-15

  • 分类号H01L21/304;B24B37/00;

  • 国家 JP

  • 入库时间 2022-08-22 01:58:47

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