BURN-IN METHOD AND BURN-IN DEVICE CONTROL SYSTEM

摘要

PROBLEM TO BE SOLVED: To stabilize quality by reducing the dispersion in the service life of electronic components. ;SOLUTION: First to third burn-in devices 11-13 are connected to a measured result processing device 15 via a network 14. The respective burn-in devices 11-13 carry out a measurement of burn-in at every sampling time TS and transmit the measured results at every sampling time to a measured result processing device 15. The measured result processing device 15 decides whether or not a damage ratio of a semiconductor device enters to a stabilization period, based on the measured results from the burn-in devices 11-13. Then, the measured result processing device 15 makes the burn-in of all burn-in devices 11-13 to be completed, when the damage ratio enters to the stabilization period regarding all burn-in devices 11-13.;COPYRIGHT: (C)2000,JPO