The reliable verification device and verification manner of the semiconductor integrated circuit and stores the verification program the storage

摘要

A semiconductor integrated circuit reliability verification device for detecting any portion of design that may cause circuit malfunction due to the effects of switching noise, comprises a partial circuit network detecting part for detecting, based on a transistor-level net list for the circuit to be verified, information concerning partial circuit networks that form part of a circuit to be verified, a maximum resistance calculating part for calculating, based on the information concerning the partial circuit network, the maximum resistance that occurs while the channel connected component is operating, a gate capacitance calculating part for calculating, based on the information concerning the partial circuit network, the total gate capacitance for the portions but the inverter of a driven circuit, and an error judging part for calculating the value of evaluation function, based on the value of maximum resistance and the total gate capacitance, and judging whether or not the calculated value is in violation of the design criteria.