A METHOD AND APPARATUS FOR INCREASING THE SPEED OF ELECTROMAGNETIC SCANNING OF ELECTRONIC DEVICES

摘要

Disclosed is a method and apparatus for increasing the speed ofelectromagnetic emissionscanning of an electronic device under test. Included is an array ofelectromagnetic emissiondetection probes, decoder and driver circuits to address a selected number ofprobes in the probearray in a predetermined manner, a micro-controller to instruct and supervisethe decoder anddriver circuits, an analogue to digital converter, a memory circuit, a systemcontroller and adisplay. The device under test is energized and located adjacent to the arrayof probes. Themicro-controller instructs the decoder and driver circuits to address,individually and successivelya specific group or list of probes during a first scanning period. Theemission level from each ofthe addressed probes is measured, digitized and stored in memory circuits as afirst data set. Thesystem controller integrates, scales, maps and displays the first data set onthe display forinterpretation by an operator concomitant with the next data set beingcollected by themicro-controller. Collected data sets are passed to the system controller forprocessing and thesampling steps are repeated until the operator receives the desired level ofelectromagneticcharacterization and terminates the scan.