METHOD AND DEVICE FOR EVALUATING SPECTROSCOPIC MEASUREMENTS ON SOLID MATERIALS WITH SPATIALLY AND/OR TIME-VARIABLE SURFACES

摘要

If materials of spatially and/or time-variable surfaces are measured by spectroscopic measurement, the varying distance to the surfaces results in substantial error rates when the signal intensities are detected and evaluated on the basis of said spectrums. According to the invention, the derivations in terms of the wavelength of continuously detected spectrums are evaluated instead of their intensities or absorptions, thereby removing the effects of the spatially and/or time-variable distance of the material surface to the source of radiation. Additionally, a series of mechanical measures are provided which minimize the unavoidable varying distances between sensor and sample already before the measurements are taken.