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CdTe CRYSTAL OR CdZnTe CRYSTAL AND METHOD FOR PREPARING THE SAME

机译:CdTe晶体或CdZnTe晶体及其制备方法

摘要

A CdTe crystal or CdZnTe crystal exhibiting a reduced value for dislocation density (EPD) and a half width (FWHM) of two crystal X-ray locking curve and containing no deposition of Cd or Te, and a method for preparing the crystal. Such a crystal is prepared by a method in which a CdTe crystal or CdZnTe crystal is generated and the crystal is allowed to stand at a temperature of 700 to 1050 °C, under a pressure of Cd such that the stoichiometry of the crystal at the temperature is held for a time t satisfying the equation 1: {L(r), (L(z))}/2 {4 exp(-1.15/kT)xt}1/2 wherein L(r) and L(z) represent a diameter and a length of the above crystal, respectively, and thereafter the crystal is cooled down in a way such that temperatures of the crystal and a Cd reservoir satisfy the equation 2: -288+1.68xT¿Cd? TCdTe 402+0.76xT¿Cd?
机译:一种CdTe晶体或CdZnTe晶体,其显示出两个晶体X射线锁定曲线的位错密度(EPD)和半宽度(FWHM)降低的值,并且不沉积Cd或Te,并且其制备方法。通过产生CdTe晶体或CdZnTe晶体并且使该晶体在Cd的压力下在700至1050℃的温度下静置以使得该晶体在该温度下的化学计量的方法来制备这种晶体。保持满足公式1的时间t:{L(r),(L(z))} / 2 <{4 exp(-1.15 / kT)xt} 1/2其中L(r)和L(z )分别代表上述晶体的直径和长度,然后将晶体冷却,使晶体和Cd储库的温度满足公式2:-288 + 1.68xT?Cd?

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