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METHOD FOR TESTING APPLICATION SPECIFIC INTEGRATED CIRCUIT OF EXCHANGE SYSTEM FOR WIRELESS LINKAGE

机译:无线链接交换系统应用专用集成电路的测试方法

摘要

Purpose: a kind of method, for testing a specific integrated circuit (ASIC) for an exchange system for wirelessly chain by testing whether that the ASIC for building a wireless transceiver in is the prestige for being normally arranged to increase a kind of equipment. Construction: a kind of method includes the following steps: for test a specific integrated circuit (ASIC) for the exchange system for a wireless system: checking whether that a test command is entered for test whether ASIC is wrong; For measuring the output data of a line error ratio, to an input port of ASIC in corresponding with the input of test command; Line error ratio is calculated, a response data is entered by an output port of ASIC; Decide whether ASIC be it is wrong, by comparing with a predetermined standard value calculating error ratio.
机译:目的:一种方法,用于通过测试用于构建无线收发器的ASIC是否具有通常用于增加一种设备的信誉,来测试用于无线链交换系统的专用集成电路(ASIC)。构造:一种方法包括以下步骤:测试用于无线系统的交换系统的特定集成电路(ASIC):检查是否输入了测试命令以测试ASIC是否错误;为了测量线错误率的输出数据,将其与测试命令的输入相对应地送至ASIC的输入端口;计算线路错误率,并通过ASIC的输出端口输入响应数据;通过与预定的标准值计算错误率进行比较,确定ASIC是否错误。

著录项

  • 公开/公告号KR20000044473A

    专利类型

  • 公开/公告日2000-07-15

    原文格式PDF

  • 申请/专利权人 SAMSUNG THOMSON CSF SYSTEMS CO. LTD.;

    申请/专利号KR19980060972

  • 发明设计人 KIM WAN HO;

    申请日1998-12-30

  • 分类号H04M3/26;

  • 国家 KR

  • 入库时间 2022-08-22 01:45:30

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