MEMORY TEST CIRCUIT AND METHOD FOR SEARCHING FAIL POSITION

摘要

PURPOSE: A memory test circuit and a method for searching a fail position are provided to make possible fast test and analysis by searching a failed position by a time for progressing a pattern and to realize a complex pattern. CONSTITUTION: A comparator(COMP1) compares the data read from a test pattern to reference data and decides a pass state or a fail state. If the state is fail because the data from the test pattern is different from the reference data, the failed data is stored in a catch RAM(70) and the occurrence of fail in a CPU(central processing unit)(80) is informed. The CPU operates the time receiving the fail data with a clock and transfers the failed point to a RAM(90) by calculating. The RAM selects the data of the point and transmits the data to a display device to display.