首页> 外国专利> PROCESS FOR DEPOSITING HIGHLY DOPED POLYSILICON LAYER ON STEPPED SURFACE OF SEMICONDUCTOR WAFER RESULTING IN ENHANCED STEP COVERAGE

PROCESS FOR DEPOSITING HIGHLY DOPED POLYSILICON LAYER ON STEPPED SURFACE OF SEMICONDUCTOR WAFER RESULTING IN ENHANCED STEP COVERAGE

机译:在半导体晶片晶圆的阶梯状表面上沉积高度掺杂的多晶硅层的过程,导致阶梯覆盖率提高

摘要

A polysilicon deposition process is disclosed for forming a doped polysilicon layer over a stepped surface (40, 50) on a semiconductor wafer (30) having the deposition characteristics and resulting profile of an undoped polysilicon layer which comprises: depositing doped polysilicon (60) on the stepped surface (40, 50) depositing undoped polysilicon (70) over the doped polysilicon, repeating the doped and undoped depositions cyclically until the desired amount of polysilicon has been deposited, and then annealing the deposited polysilicon to uniformly distribute the dopant throughout the entire deposited polysilicon layer. IMAGE
机译:公开了一种用于在半导体晶片(30)上的阶梯状表面(40、50)上形成掺杂的多晶硅层的多晶硅沉积工艺,其具有未掺杂的多晶硅层的沉积特性和所得轮廓,其包括:在其上沉积掺杂的多晶硅(60)。台阶表面(40、50)在掺杂的多晶硅上沉积未掺杂的多晶硅(70),循环重复掺杂和未掺杂的沉积,直到沉积了所需数量的多晶硅为止,然后对沉积的多晶硅进行退火,以使掺杂剂均匀地分布在整个多晶硅中沉积的多晶硅层。 <图像>

著录项

  • 公开/公告号KR100239283B1

    专利类型

  • 公开/公告日2000-01-15

    原文格式PDF

  • 申请/专利权人 APPLIED MATERIALS INC.;

    申请/专利号KR19910012097

  • 发明设计人 SIRAEL BEINGLASS;

    申请日1991-07-16

  • 分类号H01L21/20;

  • 国家 KR

  • 入库时间 2022-08-22 01:45:09

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号