首页> 外国专利> MANUFACTURING METHOD OF POLYSILICON THIN FILM USING LASER ANNEALING AND THE MANUFACTURING METHOD OF THIN FILM TRANSISTOR USING THE SAME

MANUFACTURING METHOD OF POLYSILICON THIN FILM USING LASER ANNEALING AND THE MANUFACTURING METHOD OF THIN FILM TRANSISTOR USING THE SAME

机译:激光退火制备多晶硅薄膜的方法和相同方法制备薄膜晶体管的方法

摘要

A method of manufacturing a polysilicon thin film and a method of manufacturing a thin film transistor using the same are described. The polysilicon thin film manufacturing method includes the steps of forming an amorphous silicon film on a substrate having a stepped pattern, and irradiating a laser to the amorphous silicon film so that the amorphous silicon film formed at portions except the sidewall portions of the pattern is changed to a polysilicon film. Characterized in that it comprises a step. According to this, a polysilicon thin film capable of suppressing leakage current while maintaining a relatively large ON current without adding another process can be manufactured, and a thin film transistor having improved characteristics can be manufactured using the same.
机译:描述了一种制造多晶硅薄膜的方法和一种使用该方法制造薄膜晶体管的方法。多晶硅薄膜的制造方法包括以下步骤:在具有阶梯状图案的基板上形成非晶硅膜;以及对非晶硅膜照射激光,以使形成于图案的侧壁部以外的部分的非晶硅膜变化。多晶硅膜。其特征在于它包括一个步骤。据此,可以制造能够在不增加其他工序的情况下保持较大的导通电流的同时抑制漏电流的多晶硅薄膜,并且可以使用该薄膜制造具有改善的特性的薄膜晶体管。

著录项

  • 公开/公告号KR100243276B1

    专利类型

  • 公开/公告日2000-02-01

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO LTD.;

    申请/专利号KR19960080112

  • 发明设计人 최권영;한민구;배병성;

    申请日1996-12-31

  • 分类号H01L29/786;

  • 国家 KR

  • 入库时间 2022-08-22 01:45:05

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