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DOWNSTREAM AMMONIA PLASMA PASSIVATION OF GAAS

机译:GAAS下流氨等离子体钝化

摘要

The inventors have discovered that by exposing gallium arsenide surfaces to downward ammonia plasma products, the surface can be passivated dry without heating or ion bombardment. Specifically, the gallium exposed by placing the workpiece into the exhaust chamber, then evacuating the chamber, generating an ammonia plasma at a distance from the workpiece, and lowering the plasma product into contact with the workpiece. The workpiece having the arsenide surface is surface passivated. It is preferable that plasma gas pressure is 0.5-0.6 Torr, the temperature of a board | substrate is less than 100 degreeC, and exposure time is 5 minutes or more. Plasma must be generated at a point far enough (about 10 cm or more away from the workpiece) to avoid collisions with the workpiece surface and ions, which may damage the workpiece surface, and the downwardly reactive plasma product must be generated. It should be generated close enough (within about 30 cm) to the workpiece so that it can reach, and the workpiece is placed outside the visible range of the plasma to prevent damage from radiation (UV, visible and X-ray). As a result, rapid and stable surface passivation at room temperature can be achieved which can be used in conjunction with the batch dry process techniques used to fabricate integrated circuits.
机译:发明人发现,通过将砷化镓表面暴露于向下的氨等离子体产物,可以在不加热或不轰击离子的情况下将表面钝化干燥。具体地,通过将​​工件放入排气室中,然后排空该室,在距工件一定距离处产生氨等离子体,并降低等离子体产物使其与工件接触而暴露出镓。具有砷化物表面的工件被表面钝化。等离子体气体压力优选为0.5〜0.6Torr。基板小于100℃,曝光时间为5分钟以上。必须在足够远的点(距工件约10 cm或更多)处产生等离子体,以避免与工件表面和离子的碰撞,这可能会损坏工件表面,并且必须产生向下反应的等离子体产物。它的产生应与工件足够近(约30厘米以内),以便可以到达,并且将工件放置在等离子可见范围之外,以防止受到辐射(紫外线,可见光和X射线)的损害。结果,可以实现在室温下快速且稳定的表面钝化,其可以与用于制造集成电路的间歇干燥工艺技术结合使用。

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