首页> 外国专利> AL-NI-Y ALLOY FILMS FOR ELECTRODES OF SEMICONDUCTOR DEVICES AND SPUTTERING TARGETS FOR DEPOSITING THE AL-NI-Y ALLOY FILMS

AL-NI-Y ALLOY FILMS FOR ELECTRODES OF SEMICONDUCTOR DEVICES AND SPUTTERING TARGETS FOR DEPOSITING THE AL-NI-Y ALLOY FILMS

机译:用于半导体器件电极的Al-Ni-Y合金膜以及用于沉积Al-NI-Y合金膜的溅射靶

摘要

The invention provides an Al alloy film for use as an electrode of a semiconductor device and also provides an Al alloy sputtering target used to produce such an Al alloy film wherein the Al alloy film has not only a low resistivity equal to or less than 5 mu OMEGA cm and a high hillock resistance (property of hillock suppression) but also a high dielectric strength when it is anodized into an anodic oxide film and wherein the Al alloy film has a composition such that the Ni content is equal to or greater than 0.3 at % and the Y content is equal to or greater than 0.3 at % and such that 0.22 CNi+0.74 CY1.6 at % where CNi denotes the Ni content (at %) and CY denotes the Y content (at %) and further wherein, in order to deposit the Al alloy film by sputtering, a spray forming Al alloy target containing Ni and Y is used.
机译:本发明提供了用作半导体器件的电极的铝合金膜,并且还提供了用于制造这种铝合金膜的铝合金溅射靶,其中铝合金膜不仅具有等于或小于5μm的低电阻率。 OMEGA cm和高的小丘电阻(抑制小丘的特性),但在将其阳极氧化成阳极氧化膜时也具有很高的介电强度,并且其中Al合金膜的成分使得Ni含量等于或大于0.3。且Y含量等于或大于0.3 at%,且0.22 CNi + 0.74 CY <1.6 at%,其中CNi表示Ni含量(at%),CY表示Y含量(at%),并且,为了通过溅射来沉积铝合金膜,使用了包含Ni和Y的喷射形成铝合金靶。

著录项

  • 公开/公告号KR100265484B1

    专利类型

  • 公开/公告日2000-10-02

    原文格式PDF

  • 申请/专利权人 KOBE STEEL LTD.;

    申请/专利号KR19980013208

  • 发明设计人 ONISHI TAKASHI;TAKAGI KATSUTOSHI;

    申请日1998-04-14

  • 分类号H01L21/285;

  • 国家 KR

  • 入库时间 2022-08-22 01:44:42

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