Non-destructive testing device especially for quality control testing of soldered joints on electronic components

摘要

The arrangement includes a test device (52) detecting a radiation beam extending from the object (42) being tested along a radiation path (O) in order to generate at least one image of the object (52) useable for optical testing. A manually operated optical arrangement (30) is used for deflecting at least part of the radiation from the tested object into the beam-path of the test device (52). The optical arrangement is specifically a flat mirror (30) for deflecting the light reflected from the object (42) into the radiation path (O) of the test device (52), the flat mirror (30) being mounted on a holder (16) and swivelled about an axis (A).