首页> 外国专利> Optionally-electrostatic, sub-micron particle filtration system treating gases for analysis in chamber by calibrated sensors, includes fully-automatic gas-flushing equipment for filter, preventing sensor contamination

Optionally-electrostatic, sub-micron particle filtration system treating gases for analysis in chamber by calibrated sensors, includes fully-automatic gas-flushing equipment for filter, preventing sensor contamination

机译:可选的静电亚微米颗粒过滤系统,用于处理气体,通过校准后的传感器在室内进行分析,包括用于过滤器的全自动气体冲洗设备,可防止传感器污染

摘要

The filtration system comprises fully-automatic gas-flushing equipment, for continuous or intermittent cleaning. Preferred Features: The filter (1) is blasted by pressurized medium. With the fan shut off, a measured quantity of pre-pressurized medium in a cylinder (10) is delivered via a flushing line into the filter, to leave with the finest particles, via an outlet. In cyclic operation, the sample flow is interrupted by shutting off the fan, followed by injection of the medium. Inlet and outlet valves (8,11) open and close appropriately, ultimately restoring sample flow to the sensor chamber (2) and sensor (21). Timing is adjustable, or is controlled automatically in terms of total throughputs.
机译:过滤系统包括全自动气体冲洗设备,可进行连续或间歇清洁。首选功能:过滤器(1)用加压介质喷砂处理。在风扇关闭的情况下,量筒中的一定量的预加压介质(10)会通过冲洗管线输送到过滤器中,并通过出口留下最细的颗粒。在循环操作中,通过关闭风扇,然后注入介质来中断样品流。入口阀和出口阀(8,11)适当打开和关闭,最终恢复流向传感器腔(2)和传感器(21)的样品流。时间是可调整的,或根据总吞吐量自动控制。

著录项

  • 公开/公告号DE19900542A1

    专利类型

  • 公开/公告日2000-07-13

    原文格式PDF

  • 申请/专利权人 HGC COMPUTERTECHNIK GMBH & CO. KG;

    申请/专利号DE1999100542

  • 发明设计人 SEELIGER HANS-DIETER;KUEHN UWE;

    申请日1999-01-11

  • 分类号G01N1/34;B03C3/49;B03C3/82;G01N27/00;B03C3/80;

  • 国家 DE

  • 入库时间 2022-08-22 01:42:22

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