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Device for measuring substrate temperature has polygonal stop with essentially straight edges between substrate, radiation detector to restrict detector field of view

机译:用于测量衬底温度的装置具有多边形止挡,其在衬底之间具有基本笔直的边缘,辐射探测器限制了探测器的视场

摘要

The device has at least one radiation detector for measuring the radiation emitted by the substrate and a stop (19) for restricting the field of view of the detector arranged between the substrate and detector, whereby the edges (20) of the stop are essentially straight. A polygonal stop is used.
机译:该装置具有至少一个用于测量由基板发射的辐射的辐射探测器和用于限制布置在基板和探测器之间的探测器的视场的挡块(19),由此,挡块的边缘(20)基本上是笔直的。使用多边形挡块。

著录项

  • 公开/公告号DE19905524A1

    专利类型

  • 公开/公告日2000-09-21

    原文格式PDF

  • 申请/专利权人 STEAG RTP SYSTEMS GMBH;

    申请/专利号DE1999105524

  • 发明设计人 HAUF MARKUS;

    申请日1999-02-10

  • 分类号G01J5/20;

  • 国家 DE

  • 入库时间 2022-08-22 01:42:19

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