首页> 外国专利> Tempering increased temperatures caused by light or convection in analysis in multiwell analysis plates, especially microtitration plates, and apparatus for the method

Tempering increased temperatures caused by light or convection in analysis in multiwell analysis plates, especially microtitration plates, and apparatus for the method

机译:在多孔分析板(尤其是微量滴定板)中分析由光或对流引起的温度升高,以及用于该方法的设备

摘要

A method to temper good analysis in multiwell analysis plates (MAP), by tempering the good analysis (GA) in an individual vessel characterized in that the MAP-GA is exposed to infrared radiation, is new. An Independent claim is also included for a device to temper GA in a MAP with a heat radiation source, characterized in that the heat radiation source is provided over and/or under the MAP (1) arranged infra-red radiation source (7).
机译:通过在单个容器中回火良好分析(GA)来回火多孔分析板(MAP)中良好分析的方法是一种新方法,其特征在于MAP-GA暴露于红外辐射。还包括一种用于对具有热辐射源的MAP中的GA进行回火的设备的独立权利要求,其特征在于,该热辐射源设置在MAP(1)布置的红外辐射源(7)上方和/或下方。

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