首页> 外国专利> A process for the preparation of a deflection aperture matrix for electron beam - exposure devices, wet etching process and - an apparatus for making of the aperture matrix and electron beam - illumination device with the aperture matrix

A process for the preparation of a deflection aperture matrix for electron beam - exposure devices, wet etching process and - an apparatus for making of the aperture matrix and electron beam - illumination device with the aperture matrix

机译:一种制备用于电子束的偏转孔径矩阵的方法-曝光装置,湿法蚀刻工艺以及-用于制造孔径矩阵和电子束的设备-具有该孔径矩阵的照明装置

摘要

A process for the production of a deflection aperture matrix in an electron beam - illumination device and a wet etching process and a wet etching apparatus for the preparation of the impingement aperture matrix are disclosed. In the case of the wet etching of a substrate for the aperture matrix is a tensioning device as a holder for the substrate used in such a way that only a portion of the rear side to be etched is subjected to an etching solution, so that the surface protection film can be removed before the wet etching. According to the wet etching process, a gas in an enclosed space which is connected to a not - etched surface is connected, is initiated or discharged, as a result of which the internal pressure of the enclosed space is set. The internal pressure of the enclosed space is measured and in accordance with the determined pressure in the case of a preset value.
机译:公开了一种在电子束-照明装置中产生偏转孔径矩阵的方法以及用于制备冲击孔径矩阵的湿法蚀刻工艺和湿法蚀刻设备。在湿法刻蚀用于孔径矩阵的基板的情况下,作为用于基板的保持器的张紧装置以如下方式使用:仅对要刻蚀的背面的一部分进行刻蚀,从而使可以在湿法蚀刻之前去除表面保护膜。根据湿蚀刻工艺,引发或排出连接至未蚀刻表面的密闭空间中的气体,由此设定密闭空间的内部压力。在预设值的情况下,根据确定的压力测量封闭空间的内部压力。

著录项

  • 公开/公告号DE19928085A1

    专利类型

  • 公开/公告日2000-07-27

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORP. TOKIO/TOKYO JP;

    申请/专利号DE1999128085

  • 发明设计人 MARUYAMA SHIGERU TOKIO/TOKYO JP;

    申请日1999-06-11

  • 分类号H01L21/306;H01L49/00;H01J37/317;H01J37/09;

  • 国家 DE

  • 入库时间 2022-08-22 01:42:01

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号