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Semiconductor detector, especially a photodetector, is hardened against damaging radiation, especially laser radiation, by implanting ions which migrate to radiation-induced defects

机译:半导体检测器,尤其是光电检测器,通过注入迁移到辐射引起的缺陷的离子而硬化,以抵抗有害辐射,尤其是激光辐射

摘要

Semiconductor detector hardening against damaging radiation, by implanting ions which can migrate to radiation-induced defects. Independent claims are also included for the following: (i) manufacture of a laser radiation resistant semiconductor detector by subjecting a silicon substrate to conventional barrier layer junction formation and then implanting Cu(I) or Cu(II) ions; and (ii) a radiation resistant semiconductor material which comprises a substrate and a barrier layer junction and which contains implanted Y ions for migration to radiation-induced hole defects to form hole-Y type defects.
机译:半导体检测器通过注入可迁移到辐射引起的缺陷的离子来硬化,以抵抗有害辐射。还包括以下方面的独立权利要求:(i)通过使硅衬底经受常规的阻挡层结形成,然后注入Cu(I)或Cu(II)离子来制造抗激光辐射的半导体检测器; (ii)抗辐射的半导体材料,其包括衬底和阻挡层结,并且包含注入的Y离子,所述Y离子用于迁移到辐射引起的空穴缺陷以形成空穴-Y型缺陷。

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