首页> 外国专利> Circuit system for testing microprocessor has control register, multiplexers, feedback shift register, feedback multiple shift register, control unit feeding test commands, evaluating outputs

Circuit system for testing microprocessor has control register, multiplexers, feedback shift register, feedback multiple shift register, control unit feeding test commands, evaluating outputs

机译:用于测试微处理器的电路系统具有控制寄存器,多路复用器,反馈移位寄存器,反馈多移位寄存器,控制单元馈送测试命令,评估输出

摘要

The circuit system has a test control register (22) for feeding test commands to the instruction decoder (14), and a first multiplexer for selecting either the test command from the register or the command from the polling unit (12). A linearly fed back shift register feeds test operands to the instruction performance unit (16), and a second multiplexer selects test operands from the shift register or main memory. A fed back multiple shift register receives results from the instruction performance unit. A control unit feeds test commands to the test control register and the linear feedback shift register and evaluates an output signature of the multiple shift register. An Independent claim is also included for a method of evaluating a processor.
机译:该电路系统具有用于将测试命令馈送到指令解码器(14)的测试控制寄存器(22),以及用于从寄存器中选择测试命令或从轮询单元(12)中选择命令的第一多路复用器。线性反馈移位寄存器将测试操作数反馈到指令执行单元(16),第二多路复用器从移位寄存器或主存储器中选择测试操作数。反馈的多个移位寄存器从指令执行单元接收结果。控制单元将测试命令馈送到测试控制寄存器和线性反馈移位寄存器,并评估多重移位寄存器的输出签名。还包括关于处理器评估方法的独立权利要求。

著录项

  • 公开/公告号DE19952262A1

    专利类型

  • 公开/公告日2000-05-04

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORP. TOKIO/TOKYO;

    申请/专利号DE1999152262

  • 发明设计人 RAJSUMAN ROCHIT;YAMOTO HIROAKI;

    申请日1999-10-29

  • 分类号G06F11/00;

  • 国家 DE

  • 入库时间 2022-08-22 01:41:57

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