System with test device for testing components embedded on integrated circuit (IC), such as system-chip circuit uses hardware in IC itself with only minimum additional hardware needed for testing process

摘要

Process tests the integrated circuit chip by use of the onboard microprocessor in conjunction with additional registers and supply of test data and function specific test programs. Process includes provision of a number of registers for testing the microprocessor within IC chip; testing of microprocessor using multiple execution of orders with pseudo-random data and calculation of results by comparison with simulation results; supply of test program to processor to generate a memory test pattern; supply of test pattern to memory chip and assessing memory answer signal by the processor; and testing other function specific components by supply of function specific test programs to the components and assessment of the resulting output signals by the microprocessor. An Independent claim is made for a system for testing of integrated circuit chips using the process claimed.