首页> 外国专利> Scanning probe microscope for imaging sample surface; has feedback loop to generate drive signal for controlling probe and imaging device that uses probe signal, drive signal and relation between two signals

Scanning probe microscope for imaging sample surface; has feedback loop to generate drive signal for controlling probe and imaging device that uses probe signal, drive signal and relation between two signals

机译:扫描探针显微镜对样品表面进行成像;具有反馈回路以生成驱动信号以控制探针和使用探针信号,驱动信号以及两个信号之间的关系的成像设备

摘要

The microscope has a measurement device (2,4,4a,4b,5,6,10,17) to generate a probe signal (Vc) according to interactions between a probe (1) and a sample (3) surface (3a). A control device (8) holds the interaction constant according to a drive signal (Vp) generated by a feedback loop between the measurement device and the control device. A memory device stores a relation between the probe and drive signals. A visualization device connected to the feedback loop, the measurement device and the memory device generates an image of the surface topography, through selective use of the probe signal, the drive signal, and the relation between the two. Independent claims are included for a method to control the microscope, a signal processing system and a method to control the signal processing system.
机译:显微镜具有测量装置(2,4,4a,4b,5,6,10,17),可根据探针(1)和样品(3)表面(3a)之间的相互作用生成探针信号(Vc) 。控制装置(8)根据由测量装置和控制装置之间的反馈回路产生的驱动信号(Vp)保持相互作用常数。存储设备存储探针和驱动信号之间的关系。连接到反馈回路的可视化设备,测量设备和存储设备通过有选择地使用探测信号,驱动信号以及两者之间的关系来生成表面形貌的图像。包括用于控制显微镜的方法,信号处理系统和用于控制信号处理系统的方法的独立权利要求。

著录项

  • 公开/公告号DE19956725A1

    专利类型

  • 公开/公告日2000-06-15

    原文格式PDF

  • 申请/专利权人 NEC CORP. TOKIO/TOKYO;

    申请/专利号DE1999156725

  • 发明设计人 YUMOTO SEIJI;OOKUBO NORIO;

    申请日1999-11-25

  • 分类号G12B21/08;G01B21/30;H01J37/28;

  • 国家 DE

  • 入库时间 2022-08-22 01:41:56

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