An X-ray examination apparatus (1) includes a filter (4) which is arranged between the X-ray source (2) and the X-ray detector (3). The X-ray filter includes a large number of filter elements (5); the X-ray absorptivity of the filter elements can be adjusted by controlling the quantity of X-ray absorbing liquid (6) than individual filter elements. The filter elements are formed by metal capillary tubes or the wall of the capillary tubes, or the wall of the capillary tubes is provided with a metal layer (7). On the metal layer there is provided a dielectric layer (8) and the dielectric layer is covered by a coating layer (9). The dielectric layer is, for example a glass, parylene or polystyrene layer. The coating layer is, for example a Teflon, silane or siloxane layer. The dielectric layer can be dispensed with when a Teflon coating layer is used.
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