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Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors
Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors
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机译:确定存储单元对α粒子/宇宙射线诱发的软错误的鲁棒性的方法和装置
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摘要
Apparatus and methods for determining the robustness of a device to soft errors generated by alpha-particle and/or cosmic ray strikes. In one embodiment, the method includes the steps of producing a light pulse having a light pulse energy, applying the light pulse to the device at a predetermined location, varying the light pulse energy, and detecting soft errors in the device. In another embodiment, the apparatus includes a light source for producing a light pulse that is applied to the device at a predetermined location, a light pulse energy varying circuit coupled to the light source and configured to vary the light energy of the light pulse, and a detecting circuit coupled to the device and configured to detecting soft errors in the device.
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