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Thermal infrared detecting device capable of detecting infrared rays without influence of operating temperature
Thermal infrared detecting device capable of detecting infrared rays without influence of operating temperature
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机译:能够不受工作温度影响地检测红外线的热红外检测装置
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摘要
In a thermal infrared detecting device for detecting infrared rays having a specific wavelength, a first pixel (501) has an infrared absorber (544) and a first reflecting film (533) which have a first surface and a second surface, respectively. The first surface and the second surface are remoted from each other by a first distance equal to {. lambda.*(2m-1)/4*n1}, where &lgr; is representative of the specific wavelength; m, a natural number; and n1, a practical refractive index between the infrared absorber and the first reflecting film. The infrared absorber is included in a first upper portion (503) together with a first thermo-resistive converter (542). The first reflecting film is formed on a first lower portion which is distant from the first upper portion. A second pixel (502) has a second upper portion (504) which is located in parallel with the first upper portion and which has a second thermo- resistive converter (542). The second pixel has a second lower portion which is extended from the first lower portion and which is distant from the second upper portion.
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