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Heat maps for controlling deformations in optical components

机译:用于控制光学组件变形的热图

摘要

A system (80) for controlling deformations of optical components adapted for use with laser system aperture sharing elements (16) and deformable mirrors. The inventive system (80) includes a control loop (12, 40, 24, 20, 46, 28, 74, 78, 60, 34) for determining a desired temperature pattern. The control loop (12, 40, 24, 46, 28, 74, 78, 60, 34) provides a control signal (45) corresponding to the desired temperature pattern to a heat map applicator (18, 46, 47, 59, 60). The heat map applicator (18, 46, 47, 59, 60) applies the desired temperature pattern to the optical component (16) in response to the control signal and the optical component (16) is selectively deformed in response thereto. In a specific embodiment, the control loop (12, 40, 24, 20, 46, 28, 74, 78, 60, 34) is a closed loop control system that includes an interferometer (74). The interferometer (74) provides a first shape of the optical component (16) to a comparator circuit (20) that compares the first shape to a desired shape corresponding to the desired temperature pattern for determining the control signal. An alternative closed loop control system (12, 40, 24, 20, 46, 28, 74, 78, 60, 34) includes an infrared energy detector (12) that determines a current temperature pattern and generates the control signal in response thereto for converting the current temperature pattern to the desired temperature pattern. The heat map applicator (18, 46, 47, 59, 60) provides an electromagnetic beam (50, 52) that is swept across the optical component (16) to impart the desired temperature pattern on the optical component (16). In another illustrative embodiment, the control loop is an open loop control system that includes a complimentary electromagnetic energy beam that is swept over the optical component to form a heat pattern complimentary to the temperature pattern imparted to the optical component by a high power laser beam such that the total heat deposited on the optical component is uniform.
机译:一种用于控制光学部件的变形的系统(80),该系统适于与激光系统孔径共享元件(16)和可变形反射镜一起使用。本发明的系统(80)包括用于确定期望温度模式的控制回路(12,40、24、20、46、28、74、78、60、34)。控制回路(12、40、24、46、28、74、78、60、34)向热图施加器(18、46、47、59、60)提供与所需温度模式相对应的控制信号(45) )。热图施加器(18、46、47、59、60)响应于控制信号而将期望的温度图案施加至光学部件(16),并且光学部件(16)响应于该控制信号而选择性地变形。在特定实施例中,控制回路(12、40、24、20、46、28、74、78、60、34)是包括干涉仪(74)的闭环控制系统。干涉仪(74)将光学部件(16)的第一形状提供给比较器电路(20),该比较器电路将第一形状与对应于期望温度模式的期望形状进行比较以确定控制信号。备选的闭环控制系统(12、40、24、20、46、28、74、78、60、34)包括红外能量检测器(12),该红外能量检测器确定当前温度模式并响应于此生成控制信号以用于将当前的温度模式转换为所需的温度模式。热图施加器(18、46、47、59、60)提供电磁束(50、52),该电磁束扫过光学组件(16)以在光学组件(16)上施加所需的温度模式。在另一说明性实施例中,控制回路是开环控制系统,其包括互补的电磁能束,该电磁能束扫过光学部件以形成与由高功率激光束赋予光学部件的温度模式互补的热模式。沉积在光学组件上的总热量是均匀的。

著录项

  • 公开/公告号US6065842A

    专利类型

  • 公开/公告日2000-05-23

    原文格式PDF

  • 申请/专利权人 RAYTHEON COMPANY;

    申请/专利号US19980083551

  • 发明设计人 DAVID FINK;

    申请日1998-05-22

  • 分类号G02B7/185;G02B7/192;

  • 国家 US

  • 入库时间 2022-08-22 01:37:07

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