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Cleavage burble device null for scanning-type tunnel microscope

机译:扫描式隧道显微镜的解理破裂装置无效

摘要

PURPOSE: To easily and surely perform a process of cleaving/separating a sample even under the observational atmosphere, even in a general use small sized scanning type tunneling microscope, by combining a sample pressing member, guide member, elastic member and a fixed member so as to perform specific action. ;CONSTITUTION: A sample 1 is firmly mounted on a sample holder 2, to insert this sample holder 2 fitted to a sample stage 3. The inside of a scanning type tunneling microscope is replaced with the inert gas atmosphere. Next by operating sample stage driving micrometers 8, 9, the sample stage 3 is slid toward a direction of a fixed member 7. Then in a certain part, one end part A of a sample pressing member is brought into contact with the fixed member 7. In a certain part, the other end part of the sample pressing member 4 is brought into contact with the sample 1, but when the sample stage 3 is further moved, pressing force with an edge of the sample holder 2 serving as the supporting point (working point) is applied to the sample 1. Finally the sample 1 is cut down (cleft) by the sample pressing member 4.;COPYRIGHT: (C)1995,JPO
机译:目的:即使在通常的小型扫描型隧道显微镜下,也可以通过结合样品压紧件,导向件,弹性件和固定件,即使在观察气氛下也能轻松,可靠地进行样品的分离/分离过程。以执行特定操作。 ;组成:将样品1牢固地安装在样品架2上,以插入安装在样品台3上的样品架2。用惰性气体气氛代替扫描型隧道显微镜的内部。接下来,通过操作样品台驱动测微计8、9,使样品台3向固定部件7的方向滑动。然后,在某一部分中,使样品按压部件的一端部A与固定部件7接触。在某个部分,使样本按压构件4的另一端部与样本1接触,但是当样本台3进一步移动时,以样本保持器2的边缘为支撑点的按压力(工作点)施加到样品1上。最后,样品1被样品压紧部件4切下(裂开)。版权所有:(C)1995,JPO

著录项

  • 公开/公告号JP3123870B2

    专利类型

  • 公开/公告日2001-01-15

    原文格式PDF

  • 申请/专利权人 日本電子株式会社;

    申请/专利号JP19930335257

  • 发明设计人 末吉 孝;

    申请日1993-12-28

  • 分类号G01N13/10;G01N1/28;H01J37/20;

  • 国家 JP

  • 入库时间 2022-08-22 01:34:01

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