首页> 外国专利> MIRROR SURFACE PRECISION MEASURING INSTRUMENT FOR REFLECTION MIRROR ANTENNA AND MIRROR SURFACE CONTROL SYSTEM APPLYING THIS

MIRROR SURFACE PRECISION MEASURING INSTRUMENT FOR REFLECTION MIRROR ANTENNA AND MIRROR SURFACE CONTROL SYSTEM APPLYING THIS

机译:反射镜天线的镜面精密测量仪器及应用此的镜面控制系统

摘要

PROBLEM TO BE SOLVED: To solve such a problem that aberration cannot be suppressed suitably over the whole reflecting surface of a main reflection mirror unit 3 since the aberration caused by measurement in a Fresnel region by moving a practical sub-reflection mirror 4 in a conventional method for measuring the precision of the mirror surface of a mirror surface antenna 1 by using a high-frequency measuring radio wave. ;SOLUTION: This system uses an aberration correction sub-reflection mirror 12 in the shape of a mirror surface for compensating the aberration caused by measurement in the Fresnel region.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:为了解决这样的问题,因为在常规反射镜中通过移动实际的副反射镜4在菲涅耳区域中的测量引起的像差,所以不能在主反射镜单元3的整个反射面上适当地抑制像差。用于通过使用高频测量无线电波来测量镜面天线1的镜面精度的方法。 ;解决方案:该系统使用镜面形状的像差校正子反射镜12来补偿由菲涅耳区域的测量引起的像差。;版权:(C)2001,JPO

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