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DEVICE AND METHOD FOR COMPARATIVELY VERIFYING PATTERN AND MEDIUM WITH RECORDED COMPARATIVE PATTERN VERIFICATION PROGRAM

机译:用记录的比较模式验证程序对模式和介质进行比较验证的设备和方法

摘要

PROBLEM TO BE SOLVED: To provide a comparative pattern verifying device capable of shortening a time required for comparatively verifying a pattern while using the bit map of gray level. ;SOLUTION: This comparative pattern verifying device is provided with a basic graphic dividing part 23 for dividing design pattern data into basic graphics, a basic graphic comparing part 24 for comparing the basic graphic of the design pattern data divided by the basic graphic dividing part 23 with pattern data for electronic beam plotter, a gray level bit map preparing part 28 for preparing the gray level bit map of the basic graphics of the design pattern data and the pattern data for electronic beam plotter, which are decided as non-coincident by the basic graphic comparing part 24, and bit map comparing part 31 for comparing the gray level bit map of the basic graphics of the design pattern data with the gray level bit map of the pattern data for electronic beam plotter.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:提供一种比较模式验证装置,该装置能够在使用灰度级位图的同时缩短比较验证模式所需的时间。 ;解决方案:该比较模式验证装置具有用于将设计模式数据划分为基本图形的基本图形划分部件23,用于比较由基本图形划分部件23划分的设计图形数据的基本图形的基本图形比较部件24。利用电子束绘图仪的图案数据,灰度位图准备部分28用于准备由电子束绘图仪确定为不一致的设计图案数据和电子束绘图仪的图案数据的基本图形的灰度位图。基本图形比较部分24和位图比较部分31,用于将设计图案数据的基本图形的灰度位图与电子束绘图仪的图案数据的灰度位图进行比较。版权所有:(C)2001 ,日本特许厅

著录项

  • 公开/公告号JP2001202399A

    专利类型

  • 公开/公告日2001-07-27

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORP;

    申请/专利号JP20000012835

  • 申请日2000-01-21

  • 分类号G06F17/50;G06T7/00;H01L21/027;H01L21/82;

  • 国家 JP

  • 入库时间 2022-08-22 01:30:29

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