首页> 外国专利> HIGH-VOLTAGE GROUND FAULT RELAY TESTING CIRCUIT WITH BUILT-IN GROUND FAULT TESTING CIRCUIT

HIGH-VOLTAGE GROUND FAULT RELAY TESTING CIRCUIT WITH BUILT-IN GROUND FAULT TESTING CIRCUIT

机译:内置接地故障测试电路的高压接地故障继电器测试电路

摘要

PROBLEM TO BE SOLVED: To make it possible to execute the same performance test in an annual inspection as one executed by using a protective-relay testing device, while in a daily inspection, to detect, easily in a short time, a damage of a relay caused by a surge of lightning or the like and difficult to find by visual inspection. SOLUTION: In this testing circuit, a testing circuit Kt, Lt of a zero-phase- sequence current transformer 6 for ground fault detection is fed with power by pressing a ground-fault testing push button 1 to measure a zero-phase- sequence current. This enables, in inspection, a high-voltage ground-fault switch 12 and a ground-fault relay 11 to be inspected easily in a short time. When the ground-fault relay is supposed to have been damaged, terminals Va, Vc of a TC withdrawal coil 9 are opened and the push button is used to detect the damage of the ground-fault relay.
机译:解决的问题:在年度检查中,可以执行与使用保护继电器测试设备进行的性能测试相同的性能测试,而在日常检查中,可以在很短的时间内轻松检测出产品的损坏。由雷电等引起的继电器,目视检查很难找到。解决方案:在该测试电路中,用于接地故障检测的零相序电流互感器6的测试电路Kt,Lt通过按下接地故障测试按钮1以测量零相序电流而被供电。 。这使得在检查中能够容易地在短时间内检查高压接地故障开关12和接地故障继电器11。当假设接地故障继电器已损坏时,TC抽出线圈9的端子Va,Vc打开,并且按钮用于检测接地故障继电器的损坏。

著录项

  • 公开/公告号JP2001084886A

    专利类型

  • 公开/公告日2001-03-30

    原文格式PDF

  • 申请/专利权人 SETOGUCHI HIROBUMI;

    申请/专利号JP19990261804

  • 发明设计人 SETOGUCHI HIROBUMI;

    申请日1999-09-16

  • 分类号H01H83/02;G01R31/00;H01H83/04;H02H3/05;H02H3/34;

  • 国家 JP

  • 入库时间 2022-08-22 01:30:05

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