RELIEVING AND ANALYZING METHOD FOR DEFECT OF MEMORY AND MEMORY TEST DEVICE INCORPORATING DEFECT RELIEVING AND ANALYZING DEVICE APPLYING THIS ANALYZING METHOD

摘要

PROBLEM TO BE SOLVED: To provide a defect analyzing method of a memory by which must- repair of a memory can be retrieved at high speed and simulation processing relieving can be performed at high speed at the time of detection of must-repair. SOLUTION: This device is provided with a row address defective cell storing memory RFC and a column address defective cell storing memory CFC totalizing the number of defective cells every row addresses or every column addresses in the direction of row address and column address and storing them, either of then is read out, the number of defective cells is compared with the number of spare lines for each address, a state in which the number of defective cells existing in each address exceeds the number of spare lines is discriminated as must-repair, simulation of defect relieving is performed at the time of detection of must-repair.