首页> 外国专利> METHOD AND DEVICE FOR REAL TIME NON-DESTRUCTIVE DETERMINATION OF RESIDUAL STRESSES IN OBJECTS BY OPTICAL HOLOGRAPHIC INTERFEROMETRY TECHNIQUE

METHOD AND DEVICE FOR REAL TIME NON-DESTRUCTIVE DETERMINATION OF RESIDUAL STRESSES IN OBJECTS BY OPTICAL HOLOGRAPHIC INTERFEROMETRY TECHNIQUE

机译:光学全息干涉技术实时非破坏性确定物体残余应力的方法和装置

摘要

This invention relates to a method and device for non-destructive testing of details, machine units and mechanisms, various materials, and in particular, to a method and device for non-destructive determination of residual stresses which are based on the optical holographic interferometry technique. First, a hologram of the investigation area of the object in its initial state is registered. Then the release of the residual stresses in an investigation point in the investigation area is performed by exposing the surface of the object to a high-current electric pulse with rectangular shape. Finally, an interferogram of the exact same area of the object is made, and the residual stresses at the investigation area are determined from the shape and size of the fringes in the interferogram.
机译:本发明涉及对零件,机器单元和机构,各种材料进行无损检测的方法和装置,尤其涉及一种基于光学全息干涉技术的无损测定残余应力的方法和装置。 。首先,记录物体在其初始状态下的研究区域的全息图。然后,通过将物体的表面暴露于矩形的高电流电脉冲中,来释放研究区域中的研究点中的残余应力。最后,制作出与物体完全相同区域的干涉图,并根据干涉图中条纹的形状和大小确定研究区域的残余应力。

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