首页> 外国专利> HIGH-RESOLUTION LITTROW SPECTROMETER AND METHOD FOR THE QUASI-SIMULTANEOUS DETERMINATION OF A WAVELENGTH AND A LINE PROFILE

HIGH-RESOLUTION LITTROW SPECTROMETER AND METHOD FOR THE QUASI-SIMULTANEOUS DETERMINATION OF A WAVELENGTH AND A LINE PROFILE

机译:高精度谱仪和准同时测定波长和谱线的方法

摘要

The invention relates to a spectrometer (10) with a dispersive element (16) that can be displaced between at least two positions. In the first position, the simply dispersed radiation (44) of a selected wavelength is reflected directly back in the incident beam path (42), while in the second position the dispersed radiation (32) of the selected wavelength can be directed to a reflective element (30) that is positioned such that the radiation (34) can be directed at least one more time across the dispersive element (16) and then back to the incident beam path (38). The spectrometer is provided with a device, for example, a mirror, an echelle grating or a prism that deflects the beam from the plane of dispersion, which is arranged in such a manner that the simply dispersed beam (34) runs in another plane than the multiply dispersed beam (36). The mirror (30) is inclined by an axis (54) that extends parallel to the plane of dispersion and perpendicular to the incident beam (32).
机译:本发明涉及一种具有可在至少两个位置之间移动的色散元件(16)的光谱仪(10)。在第一位置,选定波长的简单散射辐射(44)在入射光束路径(42)中直接反射回去,而在第二位置中,选定波长的散射辐射(32)可以定向到反射光元件(30)被定位成使得辐射(34)可以被引导至少一倍的时间穿过色散元件(16),然后返回到入射光束路径(38)。光谱仪配备有将光束从色散平面偏转的装置,例如反射镜,阶梯光栅或棱镜,其布置方式是使简单色散的光束(34)在不同于散射平面的另一平面中传播。多重分散光束(36)。反射镜(30)由平行于色散平面并垂直于入射光束(32)延伸的轴线(54)倾斜。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号